Skip to main content
TU-Clausthal Institute for Energy Research and Physical Technologies

Laboratories

Laboratory 422

Measuring methods

Our department is primarily concerned with the characterization of solid surfaces and chemical reactions on surfaces. The most important methods include various electron spectroscopic methods and scanning probe techniques.

Some of the methods are briefly explained here.

For a generally understandable presentation of the most important methods of surface chemistry, see here.

Metastable Impact Electron Spectroscopy

MIES is a very surface-sensitive examination method.

Ultraviolet Photoelectron Spectroscopy

In photoelectron spectroscopy, photons release electrons from the solid.

X-ray Photoelectron Spectroscopy

X-ray photoelectron spectroscopy (XPS) is the term used to describe photoelectron spectroscopy that uses excitation energies greater than 100 eV.

Atomic Force Microscopy

Atomic force microscopy (AFM) is a scanning probe method for imaging the surfaces of solids in real space.

Scanning Tunneling Microscopy

Scanning tunneling microscopy (STM) is a scanning probe method for imaging the surfaces and interfaces of solids or liquids in real space.