Equipment

Auger spectroscope

Measuring methods:

Scanning Auger microscopy
Lateral resolutions: ~ 10 nm in Auger mode
Auger depth profile investigations with 1 nm depth resolution
Fracture edge examinations
SEM< 5 nm in secondary electron microscopy
XPS

Link to the Auger nanoprobe

Electron emission microscopy

for direct (non-scanning) imaging of surfaces by excitation with slow electrons (LEEM), UV light (PEEM) and metastable He atoms (MIEEM)
for direct (non-scanning) imaging of surfaces by excitation with femtosecond laser pulses (single-photon and two-photon photoelectron emission microscopy:PEEM)

Atomic force microscopy

(Digital Instruments model Dimension 3100) with the possibility of tunnel current atomic force microscopy

Femtosecond laser system

Femtosecond Ti:sapphire laser system(tuning range 700-1000 nm, 1 W @ 800 nm, 80 fs. Oscillator/pump laser: Spectra Physics Tsunami/Millennia
Femtosecond Ti:sapphire amplifier system (800 nm, 1000 Hz, 2 mJ, 90 fs. Amplifier/pump laser: Positive Light Spitfire/Evolution)
Optical parametric amplifier for femtosecond pulses (tuning range 470-2600 nm, 1000 Hz, 150 µJ @ 710 nm, ~100 fs, Light Conversion Topas model)

Picosecond laser system

Picosecond Nd:YAG laser system(1.064 µm, 500 Hz, 9 mJ, 25 ps, oscillator: Lightwave Electronics, amplifier: in-house construction with diode laser-pumped Nd:YAG amplifier heads from ILT Aachen)
Optical parametric amplifier for picosecond infrared pulses (tuning range 1.2-8.3 µm, 500 Hz, 50 µJ @ 5 µm, 25 ps, home-made with BBO and _AgGaS2 crystals)

Scanning tunneling microscope

(Molecular Imaging model Picoscan 2100), microscopy of electrode surfaces under electrochemical conditions with potential control (scanning range 2µm x 2µm lateral and 0.7µm vertical; tunnel currents of 1pA-100nA)

Millipore Gradient A10 ultrapure water system

(R>18MΩcm, Total Oxidizable Carbon (TOC) < 4ppb)

Auger nanoprobe

LEEM

PEEM

Atomic force microscope

fs laser system

ps laser system

Scanning tunneling microscope

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