Services

Topographic and spatially resolved chemical characterization of surfaces

Scanning eye microscopy for spatially resolved characterization of the chemical composition of surfaces with the possibility of imaging secondary electrons and depth profile analysis. The measurements require vacuum conditions. Lateral resolutions: ~ 1 µm in auger mode and < 100 nm in secondary electron microscopy

Atomic force microscopy for topographical characterization of surfaces. Resolution: ~ 1 nm lateral and < 1 nm vertical

Tunneling current atomic force microscopy for spatially resolved electrical and topographical characterization of thin dielectric layers.
Resolution: ~ 1 nm lateral and < 1 nm vertical

Electron emission microscopy of surfaces (direct imaging, non-scanning method). By imaging low-energy electrons from the outermost atomic layers of the surface, the method is considerably more surface-sensitive than secondary electron microscopy. Chemical contrast is possible. Suitable for investigating dynamic surface processes. The measurements require vacuum conditions. Lateral resolution between 15 and 100 nm, depending on sample and type of excitation

Discuss your application with us so that we can find the optimum examination method for you.

Dr. Klaus Stallberg
Room 318
Tel: +49 5323 72-3615
Fax: +49 5323 72-3600
Email: klaus.stallberg@tu-clausthal.de

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