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TU-Clausthal Institute for Energy Research and Physical Technologies

REM

A scanning electron microscope (SEM) is a microscopy method in which an electron beam is scanned over the object to be imaged and the interaction of the electrons with the object produces an enlarged image. These images are images of the object surfaces and have a high depth of field.

Examples of some applications

A few applications for SEM are shown here.

Examination of the shape of STM tips

Three different STM tips are shown here as examples. The SEM should be used to determine the shape and diameter of the tip in order to determine the best manufacturing process.